31.080 - Semiconductor devices
Showing 641–656 of 1120 results
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BS EN 62416:2010
Semiconductor devices. Hot carrier test on MOS transistors Published By Publication Date Number of Pages…
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BS EN 62047-6:2010
Semiconductor devices. Micro-electromechanical devices – Axial fatigue testing methods of thin film materials Published By…
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BS EN 60146-2:2000
Semiconductor convertors. General requirements and line commutated convertors – Self-commutated semiconductor converters including direct d.c.…
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BS EN IEC 60749-37:2022 – TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods – Board level drop test method…
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BS EN IEC 60749-28:2022 – TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods – Electrostatic discharge (ESD) sensitivity testing.…
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BS IEC 62951-9:2022
Semiconductor devices. Flexible and stretchable semiconductor devices – Performance testing methods of one transistor and…
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BS IEC 62880-1:2017:2020 Edition
Semiconductor devices. Stress migration test standard – Copper stress migration test standard Published By Publication…
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BS EN 62047-16:2015
Semiconductor devices. Micro-electromechanical devices – Test methods for determining residual stresses of MEMS films. Wafer…
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BS EN 62047-21:2014
Semiconductor devices. Micro-electromechanical devices – Test method for Poisson’s ratio of thin film MEMS materials…
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BS EN 60749-27:2006+A1:2012:2013 Edition
Semiconductor devices. Mechanical and climatic test methods – Electrostatic discharge (ESD) sensitivity testing. Machine model…
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BS EN 62047-12:2011
Semiconductor devices. Micro-electromechanical devices – Bending fatigue testing method of thin film materials using resonant…
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BS EN 62047-18:2013
Semiconductor devices. Micro-electromechanical devices – Bend testing methods of thin film materials Published By Publication…
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BS EN 62047-15:2015
Semiconductor devices. Micro-electromechanical devices – Test method of bonding strength between PDMS and glass Published…
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BS EN 60749-29:2011
Semiconductor devices. Mechanical and climatic test methods – Latch-up test Published By Publication Date Number…
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BS EN IEC 62007-1:2015+A1:2022
Semiconductor optoelectronic devices for fibre optic system applications – Specification template for essential ratings and…
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BS EN 61975:2010+A2:2022
High-voltage direct current (HVDC) installations. System tests Published By Publication Date Number of Pages BSI…