31.080 - Semiconductor devices
Showing 625–640 of 1120 results
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BS EN 60749-4:2017
Semiconductor devices. Mechanical and climatic test methods – Damp heat, steady state, highly accelerated stress…
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BS IEC 62951-1:2017:2018 Edition
Semiconductor devices. Flexible and stretchable semiconductor devices – Bending test method for conductive thin films…
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BS IEC 62880-1:2017:2020 Edition
Semiconductor devices. Stress migration test standard – Copper stress migration test standard Published By Publication…
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BS EN 60191-6-18:2010
Mechanical standardization of semiconductor devices – General rules for the preparation of outline drawings of…
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BS EN 62047-13:2012
Semiconductor devices. Micro-electromechanical devices – Bend-and shear-type test methods of measuring adhesive strength for MEMS…
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BS EN 62047-10:2011
Semiconductor devices. Micro-electromechanical devices – Micro-pillar compression test for MEMS materials Published By Publication Date…
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BS QC 750100:1986+A2:1996:2010 Edition
Harmonized system of quality assessment for electronic components. Discrete semiconductor devices. Sectional specification Published By…
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BS EN 60749-34:2010:2011 Edition
Semiconductor devices. Mechanical and climatic test methods – Power cycling Published By Publication Date Number…
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BS EN 60749-7:2011
Semiconductor devices. Mechanical and climatic test methods – Internal moisture content measurement and the analysis…
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BS EN 60749-19:2003+A1:2010
Semiconductor devices. Mechanical and climatic test methods – Die shear strength Published By Publication Date…
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BS EN 60749-40:2011
Semiconductor devices. Mechanical and climatic test methods – Board level drop test method using a…
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BS EN 60191-6-20:2010
Mechanical standardization of semiconductor devices – General rules for the preparation of outline drawings of…
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BS IEC 60747-14-1:2010
Semiconductor devices – Semiconductor sensors. Generic specification for sensors Published By Publication Date Number of…
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BS EN 62415:2010
Semiconductor devices. Constant current electromigration test Published By Publication Date Number of Pages BSI 2010…
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BS EN 60191-6-19:2010
Mechanical standardization of semiconductor devices – Measurement methods of the package warpage at elevated temperature…
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BS EN 62417:2010
Semiconductor devices. Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) Published By Publication…