31.080 - Semiconductor devices
Showing 609–624 of 1120 results
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BS EN 60747-16-5:2013+A1:2020
Semiconductor devices – Microwave integrated circuits. Oscillators Published By Publication Date Number of Pages BSI…
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BS IEC 62899-503-3:2021
Printed electronics – Quality assessment. Measuring method of contact resistance for the printed thin film…
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BS EN IEC 60068-2-13:2021
Environmental testing – Tests. Test M: Low air pressure Published By Publication Date Number of…
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BSI PD IEC TR 60747-5-12:2021
Semiconductor devices – Optoelectronic devices. Light emitting diodes. Test method of LED efficiencies Published By…
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BS IEC 60747-7:2010+A1:2019
Semiconductor devices. Discrete devices – Bipolar transistors Published By Publication Date Number of Pages BSI…
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BS IEC 62047-35:2019:2021 Edition
Semiconductor devices. Micro-electromechanical devices – Test method of electrical characteristics under bending deformation for flexible…
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BS IEC 60747-14-11:2021
Semiconductor devices – Semiconductor sensors. Test method of surface acoustic wave-based integrated sensors for measuring…
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BSI PD IEC/TR 63133:2017:2018 Edition
Semiconductor devices. Scan based ageing level estimation for semiconductor devices Published By Publication Date Number…
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BS EN IEC 60749-12:2018
Semiconductor devices. Mechanical and climatic test methods – Vibration, variable frequency Published By Publication Date…
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BS EN IEC 60749-13:2018
Semiconductor devices. Mechanical and climatic test methods – Salt atmosphere Published By Publication Date Number…
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BS EN IEC 60749-26:2018
Semiconductor devices. Mechanical and climatic test methods – Electrostatic discharge (ESD) sensitivity testing. Human body…
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BS EN IEC 60749-41:2020
Semiconductor devices. Mechanical and climatic test methods – Standard reliability testing methods of non-volatile memory…
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BS EN 60191-4:2014+A1:2018
Mechanical standardization of semiconductor devices – Coding system and classification into forms of package outlines…
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BS EN 60749-3:2017
Semiconductor devices. Mechanical and climatic test methods – External visual examination Published By Publication Date…
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BS EN 60749-6:2017
Semiconductor devices. Mechanical and climatic test methods – Storage at high temperature Published By Publication…
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BS IEC 60747-9:2019
Semiconductor devices – Discrete devices. Insulated-gate bipolar transistors (IGBTs) Published By Publication Date Number of…