31.080 - Semiconductor devices
Showing 577–592 of 1120 results
-
UNE-EN 150001:1991:1996 Edition
BDS: general purpose semiconductor diodes. Published By Publication Date Number of Pages AENOR 1996-11-01 11
-
UNE-EN 120008:1993:1996 Edition
BDS: light emitting diodes and infrared emitting diodes for fibre optic system or sub-system. Published…
-
UNE-EN 120006:1992:1996 Edition
BDS: pin-photodiodes for fibre optic applications. Published By Publication Date Number of Pages AENOR 1996-09-01…
-
UNE-EN 120005:1992:1996 Edition
BDS: photodiodes, photodiode arrays (not intended for fibre optic applications). Published By Publication Date Number…
-
UNE-EN 120004:1992:1996 Edition
BDS: ambient rated photocouplers with phototransistors output. Published By Publication Date Number of Pages AENOR…
-
UNE-EN 120003:1992:1996 Edition
BDS: phototransistors, photodarlington transistors, phototransistor arrays. Published By Publication Date Number of Pages AENOR 1996-09-01…
-
UNE-EN 120001:1992:1996 Edition
BDS: light emitting diodes, light emitting diode arrays, light emitting diode displays without internal logic…
-
BSI 24/30497109 DC:2024 Edition
BS EN IEC 63068-5 Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial…
-
ASTM-F1192:2024 Edition(Redline)
F1192-24 Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion…
-
ASTM-F1192:2024 Edition
F1192-24 Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion…
-
BSI 24/30492188 DC:2024 Edition
Draft BS EN 63378-6 ED1. Thermal standardization on semiconductor packages – Part 6. Thermal resistance…
-
BSI 24/30488096 DC 2024
BS EN IEC 62031 LED modules. Safety requirements Published By Publication Date Number of Pages…
-
BS EN IEC 60749-5:2024 – TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods – Steady-state temperature humidity bias life…
-
BS IEC 62047-44:2024
Semiconductor devices. Micro-electromechanical devices – Test methods for dynamic performances of MEMS resonant electric-field-sensitive devices…
-
BS IEC 62047-43:2024
Semiconductor devices. Micro-electromechanical devices – Test method of electrical characteristics after cyclic bending deformation for…
-
BSI 23/30476409 DC 2023
BS IEC 60947-10. Low-voltage switchgear and controlgear – Part 10. Semiconductor Circuit-Breakers Published By Publication…