IEC 60749-6:2002
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Semiconductor devices – Mechanical and climatic test methods – Part 6: Storage at high temperature
| Published By | Publication Date | Number of Pages |
| IEC | 2002-04-12 | 16 |
Aims at testing and determining the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive.
The contents of the corrigendum of August 2003 have been included in this copy.
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