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BSI PD IEC TS 63144-1:2020

BSI PD IEC TS 63144-1:2020

$189.07

Industrial process control devices. Thermographic cameras – Metrological characterization

Published By Publication Date Number of Pages
BSI 2020 48
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This part of IEC 63144 applies, in the field of metrology, to the statement and testing of technical data in datasheets and instruction manuals for thermographic cameras that are used to measure the temperature of surfaces. This includes, unless otherwise stated, both two-dimensional and one-dimensional (line cameras or line scanners) temperature measuring instruments, independently of the scanning principle (fixed multi-element detector or scanning camera system).

This document describes standard test methods to determine relevant metrological data of thermographic cameras. Manufacturers and sellers can choose relevant data and can state that the data shall be compliant with this Technical Specification.

PDF Catalog

PDF Pages PDF Title
2 undefined
4 CONTENTS
8 FOREWORD
10 INTRODUCTION
11 1 Scope
2 Normative references
3 Terms and definitions
16 4 Symbols
5 Abbreviated terms
Table 1 – Symbols
17 6 Determination of technical data
6.1 General
6.2 Measuring temperature range
6.2.1 General
Figures
Figure 1 – Schematic measuring setup
18 6.2.2 Required parameters
6.2.3 Examples of indications
6.2.4 Test condition, method and procedure for measuring temperature range
6.3 Noise equivalent temperature difference (NETD)
6.3.1 General
6.3.2 Required parameters
6.3.3 Examples of indications
19 6.3.4 Test condition, method and procedure for noise equivalent temperature difference
20 6.4 Measuring distance (d)
6.4.1 General
6.4.2 Required parameters
6.4.3 Examples of indications
6.4.4 Test condition, method and procedure for measuring distance
6.5 Field of view (FOV)
6.5.1 General
21 6.5.2 Required parameters
6.5.3 Examples of indications
6.5.4 Test condition, method and procedure for field of view
6.6 Number of image elements
6.7 Detector format used (number of detector elements used)
22 6.8 Instantaneous field of view (IFOV)
6.8.1 General
6.8.2 Required parameters
6.8.3 Example of indications
6.8.4 Test condition, method and procedure for instantaneous field of view
6.9 Slit response function (SRF)
6.9.1 General
23 6.9.2 Required parameters
6.9.3 Examples of indications
6.9.4 Test condition, method and procedure for slit response function
Figure 2 – Slit response function
24 6.10 Minimum field of view for temperature measurement (MFOVT)
6.10.1 General
Figure 3 – Minimum size of a measuring spot for temperature measurement
25 6.10.2 Required parameters
6.10.3 Example of indications
6.10.4 Test condition, method and procedure for minimum field of view for temperature measurement
26 6.11 Spectral range
6.11.1 General
6.11.2 Examples of indications
6.11.3 Test condition, method and procedure for spectral range
6.12 Emissivity setting
6.12.1 General
6.12.2 Examples of indications
6.12.3 Test condition, method and procedure for emissivity setting
6.13 Influence of the internal instrument temperature
6.13.1 General
27 6.13.2 Required parameters
6.13.3 Examples of indications
6.13.4 Test condition, method and procedure for influence of the internal instrument temperature
28 6.14 Influence of the humidity
6.14.1 General
6.14.2 Required parameters
6.14.3 Example of indications
6.14.4 Test condition, method and procedure for influence of the humidity
6.15 Long-term stability
6.15.1 General
6.15.2 Required parameters
6.15.3 Example of indication
29 6.15.4 Test condition, method and procedure for long-term stability
6.16 Short-term stability
6.16.1 General
6.16.2 Required parameters
30 6.16.3 Example of indication
6.16.4 Test condition, method and procedure for short-term stability
6.17 Repeatability
6.17.1 General
6.17.2 Required parameters
31 6.17.3 Example of indication
6.17.4 Test condition, method and procedure for repeatability
6.18 Interchangeability (spread of production)
6.18.1 General
6.18.2 Required parameters
32 6.18.3 Example of indication
6.18.4 Test condition, method and procedure for interchangeability (spread of production)
6.19 Response time
6.19.1 General
33 Figure 4 – Synchronous signal acquisition for a quantum detector
34 Figure 5 – Asynchronous signal acquisition for a quantum detector
35 Figure 6 – Asynchronous signal acquisition for a thermal detector (best case)
36 6.19.2 Required parameters
6.19.3 Example of indication
6.19.4 Test condition, method and procedure for response time
Figure 7 – Asynchronous signal acquisition for a thermal detector (worst case)
37 6.20 Exposure time
6.20.1 General
38 6.20.2 Required parameters
6.20.3 Example of indication
6.20.4 Test condition, method and procedure for exposure time
39 6.21 Warm-up time
6.21.1 General
6.21.2 Required parameters
6.21.3 Examples of indication
6.21.4 Test condition, method and procedure for warm-up time
40 6.22 Integration time setting range
6.22.1 General
6.22.2 Required parameters
6.22.3 Example of indication
6.23 Refresh rate
6.23.1 General
Figure 8 – Example of the measurement of the warm-up time
41 6.23.2 Example of indication
6.23.3 Test condition, method and procedure for refresh rate
6.24 Non-uniformity (inhomogeneity of detector responsivity)
6.24.1 General
6.24.2 Required parameters
6.24.3 Example of indication
6.24.4 Test condition, method and procedure for non-uniformity
42 6.25 Inhomogeneity equivalent temperature difference (IETD)
6.25.1 General
6.25.2 Required parameters
6.25.3 Examples of indications
6.25.4 Test condition, method and procedure for inhomogeneity equivalent temperature difference
43 6.26 Operating temperature range and air humidity range
6.26.1 General
6.26.2 Example of indication
6.26.3 Test condition, method and procedure for operating temperature range and air humidity range
6.27 Size-of-source effect (SSE)
6.27.1 General
6.27.2 Required parameters
44 6.27.3 Examples of indications
6.27.4 Test condition, method and procedure for size-of-source effect
45 Annex A (informative)Change in the indicated temperature caused by a 1 % change in the radiative interchange
Table A.1 – Change in the indicated temperature
46 Bibliography

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BSI PD IEC TS 63144-1:2020
$189.07