BS EN IEC 60749-12:2018

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Semiconductor devices. Mechanical and climatic test methods – Vibration, variable frequency

Published By	Publication Date	Number of Pages
BSI	2018	12

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Categories: 31.080.01 - Semiconductor devices in general, BSI

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Description

This part of IEC 60749 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages.

NOTE This test method describes a swept sine test. A random vibration test is described in JEDEC document JESD 22-B103.

PDF Catalog

PDF Pages	PDF Title
2	undefined
5	English CONTENTS
6	FOREWORD
8	1 Scope 2 Normative references 3 Terms and definitions 4 Test apparatus 5 Test method
9	6 Examination and test measurements 7 Failure criteria 8 Summary Table 1 – Test conditions
10	Bibliography

Additional information

Status	Definitive
Pages	12
Publication Date	2018-04-18
ISBN	978 0 580 98682 6
Standard Number	BS EN IEC 60749-12:2018
Title	Semiconductor devices. Mechanical and climatic test methods – Vibration, variable frequency
Identical National Standard Of	IEC 60749-12:2017, EN IEC 60749-12:2018
Replaces	BS EN 60749-12:2002
Descriptors	Climate, Frequencies, Mechanical testing, Electronic equipment and components, Environmental testing, Vibration testing, Destructive testing, Integrated circuits, Semiconductor devices, Variable
Publisher	BSI
Committee	EPL/47
ICS Codes	31.080.01 - Semiconductor devices in general

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BS EN IEC 60749-12:2018

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