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BS EN 62586-2:2017+A1:2021:2022 Edition

BS EN 62586-2:2017+A1:2021:2022 Edition

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Power quality measurement in power supply systems – Functional tests and uncertainty requirements

Published By Publication Date Number of Pages
BSI 2022 178
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PDF Pages PDF Title
2 undefined
37 English
CONTENTS
44 FOREWORD
46 INTRODUCTION
47 1 Scope
2 Normative references
48 3 Terms, definitions, abbreviated terms, notations and symbols
3.1 General terms and definitions
3.2 Terms and definitions related to uncertainty
49 3.3 Notations
3.3.1 Functions
3.3.2 Symbols and abbreviated terms
3.3.3 Indices
4 Requirements
4.1 Requirements for products complying with class A
50 4.2 Requirements for products complying with class S
Tables
Table 1 – Summary of type tests for class A
51 Table 2 – Summary of type tests for class S
52 5 Functional type tests common requirements
5.1 General philosophy for testing
5.1.1 System topology
5.1.2 Stabilization time
5.1.3 Measuring ranges
53 Table 3 – Testing points for each measured parameter
54 5.1.4 Single "power-system influence quantities"
55 Table 4 – List of single "power-system influence quantities"
56 5.1.5 "External influence quantities"
5.1.6 Test criteria
Table 5 – Influence of temperature
Table 6 – Influence of auxiliary power supply voltage
57 5.2 Testing procedure
5.2.1 Device under test
5.2.2 Testing conditions
5.2.3 Testing equipment
6 Functional testing procedure for instruments complying with class A according to IEC 61000-4-30
6.1 Power frequency
6.1.1 General
Table 7 – List of generic test criteria
58 6.1.2 Measurement method
6.1.3 Measurement uncertainty and measuring range
59 6.1.4 Measurement evaluation
6.1.5 Measurement aggregation
6.2 Magnitude of supply voltage
6.2.1 Measurement method
6.2.2 Measurement uncertainty and measuring range
60 6.2.3 Measurement evaluation
6.2.4 Measurement aggregation
62 6.3 Flicker
6.4 Supply voltage interruptions, dips and swells
6.4.1 General
65 Figures
Figure 1 – Overview of test for dips according to test A4.1.1
66 Figure 2 – Detail 1 of waveform for test of dips according to test A4.1.1
Figure 3 – Detail 2 of waveform for tests of dips according to A4.1.1
67 Figure 4 – Detail 3 of waveform for tests of dips according to test A4.1.1
Figure 5 – Detail 1 of waveform for test of dips according to test A4.1.2
68 Figure 6 – Detail 2 of waveform for tests of dips according to test A4.1.2
Figure 7 – Detail 1 of waveform for test of swells according to test A4.1.2
69 Figure 8 – Detail 2 of waveform for tests of swells according to test A4.1.2
Figure 9 – Sliding reference voltage test
70 6.4.2 Check dips / interruptions in polyphase system
Figure 10 – Sliding reference start up condition
71 Figure 11 – Detail 1 of waveform for test of polyphase dips/interruptions
Figure 12 – Detail 2 of waveform for test of polyphase dips/interruptions
72 6.4.3 Check swells in polyphase system
Figure 13 – Detail 3 of waveform for test of polyphase dips/interruptions
73 6.5 Supply voltage unbalance
6.5.1 General
Figure 14 – Detail 1 of waveform for test of polyphase swells
Figure 15 – Detail 2 of waveform for test of polyphase swells
74 6.5.2 Measurement method, measurement uncertainty and measuring range
6.5.3 Aggregation
6.6 Voltage harmonics
6.6.1 Measurement method
75 6.6.2 Measurement uncertainty and measuring range
76 6.6.3 Measurement evaluation
6.6.4 Measurement aggregation
78 6.7 Voltage interharmonics
6.7.1 Measurement method
79 6.7.2 Measurement uncertainty and measuring range
80 6.7.3 Measurement evaluation
6.7.4 Measurement aggregation
82 6.8 Mains signalling voltages on the supply voltage
6.8.1 Measurement method
84 6.8.2 Measurement uncertainty and measuring range
85 6.8.3 Aggregation
6.9 Measurement of underdeviation and overdeviation parameters
6.9.1 Measurement method
87 6.9.2 Measurement uncertainty and measuring range
88 6.9.3 Measurement evaluation
6.9.4 Measurement aggregation
91 6.10 Flagging
92 Figure 16 – Flagging test for class A
93 6.11 Clock uncertainty testing
6.12 Variations due to external influence quantities
6.12.1 General
Figure 17 – Clock uncertainty testing
94 6.12.2 Influence of temperature
96 6.12.3 Influence of power supply voltage
97 6.13 Rapid voltage changes (RVC)
6.13.1 RVC parameters and evaluation
6.13.2 General
Figure 18 – Example of RVC event
99 6.13.3 "No RVC" tests
Table 8 – Specification of test A13.1.1
100 Figure 19 – A13.1.1 waveform
Figure 20 – A13.1.1 waveform with RVC limits and arithmetic mean
101 Figure 21 – A13.1.2 waveform
Table 9 – Specification of test A13.1.2
102 Figure 22 – A13.1.2 waveform with RVC limits and arithmetic means
Table 10 – Specification of test A13.1.3
103 6.13.4 "RVC threshold and setup" test
Figure 23 – A13.1.3 waveform
Figure 24 – A13.1.3 waveform with RVC limits and arithmetic mean
104 Figure 25 – A13.2.1 waveform
Table 11 – Specification of test A13.2.1
105 6.13.5 "RVC parameters" test
Figure 26 – A13.2.1 waveform with RVC limits and arithmetic mean
106 Figure 27 – A13.3.1 waveform
Table 12 – Specification of test A13.3.1
107 6.13.6 "RVC polyphase" tests
Figure 28 – A13.3.1 waveform with RVC limits and arithmetic mean
108 Figure 29 – A13.4.1 waveform
Table 13 – Specification of test A13.4.1
109 6.13.7 "Voltage is in steady-state condition" tests
Table 14 – Specification of test A13.5.1
110 Figure 30 – A13.5.1 waveform
Figure 31 – A13.5.1 waveform with RVC limits and arithmetic mean
111 Figure 32 – A13.5.2 waveform
Table 15 – Specification of test A13.5.2
112 6.14 Magnitude of current
6.15 Harmonic current
6.16 Interharmonic currents
6.17 Current unbalance
6.17.1 General
Figure 33 – A13.5.2 waveform with RVC limits and arithmetic mean
113 6.17.2 Measurement method, measurement uncertainty and measuring range
7 Functional testing procedure for instruments complying with class S according to IEC 61000-4-30
7.1 Power frequency
7.1.1 General
114 7.1.2 Measurement method
7.1.3 Measurement uncertainty and measuring range
115 7.1.4 Measurement evaluation
7.1.5 Measurement aggregation
7.2 Magnitude of the supply voltage
7.2.1 Measurement method
7.2.2 Measurement uncertainty and measuring range
116 7.2.3 Measurement evaluation
7.2.4 Measurement aggregation
118 7.3 Flicker
7.4 Supply voltage interruptions, dips and swells
7.4.1 General requirements
121 Figure 34 – Detail 1 of waveform for test of dips according to test S4.1.2
Figure 35 – Detail 2 of waveform for tests of dips according to test S4.1.2
122 Figure 36 – Detail 1 of waveform for test of swells according to test S4.1.2
Figure 37 – Detail 2 of waveform for tests of swells according to test S4.1.2
123 Figure 38 – Sliding reference voltage test
Figure 39 – Sliding reference start-up condition
124 7.4.2 Check dips / interruptions in polyphase system
125 Figure 40 – Detail 1 of waveform for test of polyphase dips/interruptions
Figure 41 – Detail 2 of waveform for test of polyphase dips/interruptions
126 7.4.3 Check swells in polyphase system
Figure 42 – Detail 3 of waveform for test of polyphase dips/interruptions
127 7.5 Supply voltage unbalance
7.5.1 General
Figure 43 – Detail 1 of waveform for test of polyphase swells
Figure 44 – Detail 2 of waveform for test of polyphase swells
128 7.5.2 Measurement method, measurement uncertainty and measuring range
7.5.3 Aggregation
7.6 Voltage harmonics
7.6.1 General
129 7.6.2 Measurement method
130 7.6.3 Measurement method, measurement uncertainty and measuring range
131 7.6.4 Measurement evaluation
7.6.5 Measurement aggregation
133 7.7 Voltage interharmonics
7.8 Mains signalling voltages on the supply voltage
7.8.1 General
134 7.8.2 Measurement method
7.8.3 Measurement uncertainty and measuring range
7.8.4 Aggregation
7.9 Measurement of underdeviation and overdeviation parameters
7.10 Flagging
136 7.11 Clock uncertainty testing
Figure 45 – Flagging test for class S
137 7.12 Variations due to external influence quantities
7.12.1 General
Figure 46 – Clock uncertainty testing
138 7.12.2 Influence of temperature
140 7.12.3 Influence of power supply voltage
141 7.13 Rapid voltage changes
7.14 Magnitude of current
7.15 Harmonic current
7.16 Interharmonic currents
7.17 Current unbalance
7.17.1 General
142 7.17.2 Measurement method, measurement uncertainty and measuring range
143 8 Calculation of measurement uncertainty and operating uncertainty
144 Table 16 – Uncertainty requirements
145 Annexes
Annex A (normative) Intrinsic uncertainty and operating uncertainty,
A.1 General
A.2 Measurement uncertainty
Figure A.1 – Different kinds of uncertainties
146 A.3 Operating uncertainty
147 Annex B (informative) Overall system uncertainty
148 Annex C (normative) Calculation of measurement and operating uncertainty for voltage magnitude and power frequency
C.1 Selection of test points to verify operating uncertainty and uncertainty under reference conditions
C.2 Class A calculation examples
C.2.1 General
C.2.2 Parameter: magnitude of supply voltage, Udin = 230 V, 50/60Hz, rated range of temperature −25 °C to (55 °C
149 C.2.3 Parameter: power frequency 50/60 Hz, rated range of temperature −25 °C to (55 °C
151 Annex D (informative) Further test on dips (amplitude and phase angles changes)
D.1 Phase-to-phase or phase-to-neutral testing
D.2 Test method
Figure D.1 – Phase-to-neutral testing on three-phase systems
Figure D.2 – Phase-to-phase testing on three-phase systems
152 Table D.1 – Tests pattern
153 Annex E (informative) Further tests on dips (polyphase): test procedure
E.1 General
Figure E.1 – Example for one phase of a typical N cycle injection
154 E.2 Phase voltage dips and interruptions
E.3 Phase swells
Figure E.2 – Dip/interruption accuracy (amplitude and timing) test
155 Figure E.3 – Swell accuracy (amplitude and timing) test
156 Annex F (normative) Gapless measurements of voltage amplitude and harmonics test
F.1 Purpose of the test
F.2 Test set up
F.3 Voltage amplitude
F.3.1 Test signal
F.3.2 Result evaluation
157 F.4 Harmonics
F.4.1 Test signal
F.4.2 Result evaluation
158 F.5 Inter-harmonics
F.5.1 Test signal
F.5.2 Result evaluation
159 Annex G (informative) Gapless measurements of voltage amplitude and harmonics
Figure G.1 – Simulated signal under noisy conditions
160 Figure G.2 – Waveform for checking gapless RMS voltage measurement
Figure G.3 – 2,3 Hz frequency fluctuation
161 Figure G.4 – Spectral leakage effects for a missing sample
162 Figure G.5 – Illustration of QRMS for missing samples
Figure G.6 – Detection of a single missing sample
163 Figure G.7 – QRMS for an ideal signal, sampling error = −300 × 10−6
Figure G.8 – QRMS for an ideal signal, sampling error = 400 × 10−6
164 Figure G.9 – QRMS for an ideal signal, sampling error = 200 × 10−6
165 Figure G.10 – QH(5) with ideal test signal and perfect samplingfrequency synchronization
Figure G.11 – QH(5) with 300 × 10−6 sampling frequency error and 100 × 10−6 modulation frequency error
166 Figure G.12 – QRMS with a 20/24-cycle sliding window with an output every 10/12 cycles
Figure G.13 – Amplitude test for fluctuating component
168 Annex H (informative) Testing equipment recommendations
H.1 Testing range
H.2 Uncertainty and stability of source and reference meter
H.2.1 Uncertainty of source and reference meter
Table H.1 – Testing range
169 H.2.2 Stability of the source
H.3 Time synchronisation
H.4 Power quality functions of source and reference meter
Table H.2 – Uncertainty of source and reference meter
Table H.3 – Stability of source
170 H.5 Traceability
171 Annex I (informative) Recommendations related to a declaration of conformity (DoC) and a test report
I.1 Definitions
I.2 Recommendations
I.3 Example of IEC 62586-1 declaration of conformity
172 Table I.1 – Example of a DoC related to compliance with IEC 62586-1
173 I.4 Example of IEC 62586-2 declaration
I.4.1 General
174 I.4.2 Recommendation for IEC 62586-2 test report
Table I.2 – Example of DoC related to compliance with IEC 62586-2
175 I.4.3 Recommendation for IEC 62586-2 test summary
I.4.4 Recommendation for IEC 62586-2 test equipment information
I.4.5 Recommendation for IEC 62586-2 tested functions
176 Bibliography

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