๐Ÿ”ฅ๐Ÿ”ฅ Donโ€™t Miss Out on Our End of Autumn Sale. If you have any questions, feel free to click the bottom right corner to contact our customer service..

Concat us[email protected]
Shopping Cart

No products in the cart.

๐Ÿ”
BS EN 62586-2:2017:2018 Edition

BS EN 62586-2:2017:2018 Edition

$256.21

Power quality measurement in power supply systems – Functional tests and uncertainty requirements

Published By Publication Date Number of Pages
BSI 2018 146
PDF Format Searchable Printable Preview Now
Guaranteed Safe Checkout
Categories: ,

If you have any questions, feel free to reach out to our online customer service team by clicking on the bottom right corner. Weโ€™re here to assist you 24/7.
Email:[email protected]

This part of IEC 62586 specifies functional tests and uncertainty requirements for instruments whose functions include measuring, recording, and possibly monitoring power quality parameters in power supply systems, and whose measuring methods (class A or class S) are defined in IEC 61000-4-30.

This document applies to power quality instruments complying with IEC 62586-1.

This document can also be referred to by other product standards (e.g. digital fault recorders, revenue meters, MV or HV protection relays) specifying devices embedding class A or class S power quality functions according to IEC 61000-4-30.

These requirements are applicable in single-, dual- (split phase) and 3-phase AC power supply systems at 50 Hz or 60 Hz.

It is not the intent of this document to address user interface or topics unrelated to device measurement performance.

The document does not cover post-processing and interpretation of the data, for example with dedicated software.

PDF Catalog

PDF Pages PDF Title
2 undefined
6 English
CONTENTS
13 FOREWORD
15 INTRODUCTION
16 1 Scope
2 Normative references
17 3 Terms, definitions, abbreviated terms, notations and symbols
3.1 General terms and definitions
3.2 Terms and definitions related to uncertainty
18 3.3 Notations
3.3.1 Functions
3.3.2 Symbols and abbreviated terms
3.3.3 Indices
4 Requirements
4.1 Requirements for products complying with class A
19 4.2 Requirements for products complying with class S
Tables
Table 1 โ€“ Summary of type tests for class A
20 Table 2 โ€“ Summary of type tests for class S
21 5 Functional type tests common requirements
5.1 General philosophy for testing
5.1.1 System topology
5.1.2 Stabilization time
5.1.3 Measuring ranges
22 Table 3 โ€“ Testing points for each measured parameter
23 5.1.4 Single “power-system influence quantities”
24 Table 4 โ€“ List of single “power-system influence quantities”
25 5.1.5 “External influence quantities”
5.1.6 Test criteria
Table 5 โ€“ Influence of temperature
Table 6 โ€“ Influence of auxiliary power supply voltage
26 5.2 Testing procedure
5.2.1 Device under test
5.2.2 Testing conditions
5.2.3 Testing equipment
6 Functional testing procedure for instruments complying with class A according to IEC 61000-4-30
6.1 Power frequency
6.1.1 General
Table 7 โ€“ List of generic test criteria
27 6.1.2 Measurement method
6.1.3 Measurement uncertainty and measuring range
28 6.1.4 Measurement evaluation
6.1.5 Measurement aggregation
6.2 Magnitude of supply voltage
6.2.1 Measurement method
6.2.2 Measurement uncertainty and measuring range
29 6.2.3 Measurement evaluation
6.2.4 Measurement aggregation
31 6.3 Flicker
6.4 Supply voltage interruptions, dips and swells
6.4.1 General
34 Figures
Figure 1 โ€“ Overview of test for dips according to test A4.1.1
35 Figure 2 โ€“ Detail 1 of waveform for test of dips according to test A4.1.1
Figure 3 โ€“ Detail 2 of waveform for tests of dips according to A4.1.1
36 Figure 4 โ€“ Detail 3 of waveform for tests of dips according to test A4.1.1
Figure 5 โ€“ Detail 1 of waveform for test of dips according to test A4.1.2
37 Figure 6 โ€“ Detail 2 of waveform for tests of dips according to test A4.1.2
Figure 7 โ€“ Detail 1 of waveform for test of swells according to test A4.1.2
38 Figure 8 โ€“ Detail 2 of waveform for tests of swells according to test A4.1.2
Figure 9 โ€“ Sliding reference voltage test
39 6.4.2 Check dips / interruptions in polyphase system
Figure 10 โ€“ Sliding reference start up condition
40 Figure 11 โ€“ Detail 1 of waveform for test of polyphase dips/interruptions
Figure 12 โ€“ Detail 2 of waveform for test of polyphase dips/interruptions
41 6.4.3 Check swells in polyphase system
Figure 13 โ€“ Detail 3 of waveform for test of polyphase dips/interruptions
42 6.5 Supply voltage unbalance
6.5.1 General
Figure 14 โ€“ Detail 1 of waveform for test of polyphase swells
Figure 15 โ€“ Detail 2 of waveform for test of polyphase swells
43 6.5.2 Measurement method, measurement uncertainty and measuring range
6.5.3 Aggregation
6.6 Voltage harmonics
6.6.1 Measurement method
44 6.6.2 Measurement uncertainty and measuring range
45 6.6.3 Measurement evaluation
6.6.4 Measurement aggregation
47 6.7 Voltage interharmonics
6.7.1 Measurement method
48 6.7.2 Measurement uncertainty and measuring range
49 6.7.3 Measurement evaluation
6.7.4 Measurement aggregation
51 6.8 Mains signalling voltages on the supply voltage
6.8.1 Measurement method
53 6.8.2 Measurement uncertainty and measuring range
54 6.8.3 Aggregation
6.9 Measurement of underdeviation and overdeviation parameters
6.9.1 Measurement method
56 6.9.2 Measurement uncertainty and measuring range
57 6.9.3 Measurement evaluation
6.9.4 Measurement aggregation
60 6.10 Flagging
61 Figure 16 โ€“ Flagging test for class A
62 6.11 Clock uncertainty testing
6.12 Variations due to external influence quantities
6.12.1 General
Figure 17 โ€“ Clock uncertainty testing
63 6.12.2 Influence of temperature
65 6.12.3 Influence of power supply voltage
66 6.13 Rapid voltage changes (RVC)
6.13.1 RVC parameters and evaluation
6.13.2 General
Figure 18 โ€“ Example of RVC event
68 6.13.3 “No RVC” tests
Table 8 โ€“ Specification of test A13.1.1
69 Figure 19 โ€“ A13.1.1 waveform
Figure 20 โ€“ A13.1.1 waveform with RVC limits and arithmetic mean
70 Figure 21 โ€“ A13.1.2 waveform
Table 9 โ€“ Specification of test A13.1.2
71 Figure 22 โ€“ A13.1.2 waveform with RVC limits and arithmetic means
Table 10 โ€“ Specification of test A13.1.3
72 6.13.4 “RVC threshold and setup” test
Figure 23 โ€“ A13.1.3 waveform
Figure 24 โ€“ A13.1.3 waveform with RVC limits and arithmetic mean
73 Figure 25 โ€“ A13.2.1 waveform
Table 11 โ€“ Specification of test A13.2.1
74 6.13.5 “RVC parameters” test
Figure 26 โ€“ A13.2.1 waveform with RVC limits and arithmetic mean
75 Figure 27 โ€“ A13.3.1 waveform
Table 12 โ€“ Specification of test A13.3.1
76 6.13.6 “RVC polyphase” tests
Figure 28 โ€“ A13.3.1 waveform with RVC limits and arithmetic mean
77 Figure 29 โ€“ A13.4.1 waveform
Table 13 โ€“ Specification of test A13.4.1
78 6.13.7 “Voltage is in steady-state condition” tests
Table 14 โ€“ Specification of test A13.5.1
79 Figure 30 โ€“ A13.5.1 waveform
Figure 31 โ€“ A13.5.1 waveform with RVC limits and arithmetic mean
80 Figure 32 โ€“ A13.5.2 waveform
Table 15 โ€“ Specification of test A13.5.2
81 6.14 Magnitude of current
6.15 Harmonic current
6.16 Interharmonic currents
6.17 Current unbalance
6.17.1 General
Figure 33 โ€“ A13.5.2 waveform with RVC limits and arithmetic mean
82 6.17.2 Measurement method, measurement uncertainty and measuring range
7 Functional testing procedure for instruments complying with class S according to IEC 61000-4-30
7.1 Power frequency
7.1.1 General
83 7.1.2 Measurement method
7.1.3 Measurement uncertainty and measuring range
84 7.1.4 Measurement evaluation
7.1.5 Measurement aggregation
7.2 Magnitude of the supply voltage
7.2.1 Measurement method
7.2.2 Measurement uncertainty and measuring range
85 7.2.3 Measurement evaluation
7.2.4 Measurement aggregation
87 7.3 Flicker
7.4 Supply voltage interruptions, dips and swells
7.4.1 General requirements
90 Figure 34 โ€“ Detail 1 of waveform for test of dips according to test S4.1.2
Figure 35 โ€“ Detail 2 of waveform for tests of dips according to test S4.1.2
91 Figure 36 โ€“ Detail 1 of waveform for test of swells according to test S4.1.2
Figure 37 โ€“ Detail 2 of waveform for tests of swells according to test S4.1.2
92 Figure 38 โ€“ Sliding reference voltage test
Figure 39 โ€“ Sliding reference start-up condition
93 7.4.2 Check dips / interruptions in polyphase system
94 Figure 40 โ€“ Detail 1 of waveform for test of polyphase dips/interruptions
Figure 41 โ€“ Detail 2 of waveform for test of polyphase dips/interruptions
95 7.4.3 Check swells in polyphase system
Figure 42 โ€“ Detail 3 of waveform for test of polyphase dips/interruptions
96 7.5 Supply voltage unbalance
7.5.1 General
Figure 43 โ€“ Detail 1 of waveform for test of polyphase swells
Figure 44 โ€“ Detail 2 of waveform for test of polyphase swells
97 7.5.2 Measurement method, measurement uncertainty and measuring range
7.5.3 Aggregation
7.6 Voltage harmonics
7.6.1 General
98 7.6.2 Measurement method
99 7.6.3 Measurement method, measurement uncertainty and measuring range
100 7.6.4 Measurement evaluation
7.6.5 Measurement aggregation
102 7.7 Voltage interharmonics
7.8 Mains signalling voltages on the supply voltage
7.8.1 General
103 7.8.2 Measurement method
7.8.3 Measurement uncertainty and measuring range
7.8.4 Aggregation
7.9 Measurement of underdeviation and overdeviation parameters
7.10 Flagging
105 7.11 Clock uncertainty testing
Figure 45 โ€“ Flagging test for class S
106 7.12 Variations due to external influence quantities
7.12.1 General
Figure 46 โ€“ Clock uncertainty testing
107 7.12.2 Influence of temperature
109 7.12.3 Influence of power supply voltage
110 7.13 Rapid voltage changes
7.14 Magnitude of current
7.15 Harmonic current
7.16 Interharmonic currents
7.17 Current unbalance
7.17.1 General
111 7.17.2 Measurement method, measurement uncertainty and measuring range
112 8 Calculation of measurement uncertainty and operating uncertainty
113 Table 16 โ€“ Uncertainty requirements
114 Annexes
Annex A (normative) Intrinsic uncertainty and operating uncertainty,
A.1 General
A.2 Measurement uncertainty
Figure A.1 โ€“ Different kinds of uncertainties
115 A.3 Operating uncertainty
116 Annex B (informative) Overall system uncertainty
117 Annex C (normative) Calculation of measurement and operating uncertainty for voltage magnitude and power frequency
C.1 Selection of test points to verify operating uncertainty and uncertainty under reference conditions
C.2 Class A calculation examples
C.2.1 General
C.2.2 Parameter: magnitude of supply voltage, Udin = 230 V, 50/60Hz, rated range of temperature โˆ’25 ยฐC to (55 ยฐC
118 C.2.3 Parameter: power frequency 50/60 Hz, rated range of temperature โˆ’25 ยฐC to (55 ยฐC
120 Annex D (informative) Further test on dips (amplitude and phase angles changes)
D.1 Phase-to-phase or phase-to-neutral testing
D.2 Test method
Figure D.1 โ€“ Phase-to-neutral testing on three-phase systems
Figure D.2 โ€“ Phase-to-phase testing on three-phase systems
121 Table D.1 โ€“ Tests pattern
122 Annex E (informative) Further tests on dips (polyphase): test procedure
E.1 General
Figure E.1 โ€“ Example for one phase of a typical N cycle injection
123 E.2 Phase voltage dips and interruptions
E.3 Phase swells
Figure E.2 โ€“ Dip/interruption accuracy (amplitude and timing) test
124 Figure E.3 โ€“ Swell accuracy (amplitude and timing) test
125 Annex F (normative) Gapless measurements of voltage amplitude and harmonics test
F.1 Purpose of the test
F.2 Test set up
F.3 Voltage amplitude
F.3.1 Test signal
F.3.2 Result evaluation
126 F.4 Harmonics
F.4.1 Test signal
F.4.2 Result evaluation
127 F.5 Inter-harmonics
F.5.1 Test signal
F.5.2 Result evaluation
128 Annex G (informative) Gapless measurements of voltage amplitude and harmonics
Figure G.1 โ€“ Simulated signal under noisy conditions
129 Figure G.2 โ€“ Waveform for checking gapless RMS voltage measurement
Figure G.3 โ€“ 2,3 Hz frequency fluctuation
130 Figure G.4 โ€“ Spectral leakage effects for a missing sample
131 Figure G.5 โ€“ Illustration of QRMS for missing samples
Figure G.6 โ€“ Detection of a single missing sample
132 Figure G.7 โ€“ QRMS for an ideal signal, sampling error = โˆ’300 ร— 10โˆ’6
Figure G.8 โ€“ QRMS for an ideal signal, sampling error = 400 ร— 10โˆ’6
133 Figure G.9 โ€“ QRMS for an ideal signal, sampling error = 200 ร— 10โˆ’6
134 Figure G.10 โ€“ QH(5) with ideal test signal and perfect samplingfrequency synchronization
Figure G.11 โ€“ QH(5) with 300 ร— 10โˆ’6 sampling frequency error and 100 ร— 10โˆ’6 modulation frequency error
135 Figure G.12 โ€“ QRMS with a 20/24-cycle sliding window with an output every 10/12 cycles
Figure G.13 โ€“ Amplitude test for fluctuating component
137 Annex H (informative) Testing equipment recommendations
H.1 Testing range
H.2 Uncertainty and stability of source and reference meter
H.2.1 Uncertainty of source and reference meter
Table H.1 โ€“ Testing range
138 H.2.2 Stability of the source
H.3 Time synchronisation
H.4 Power quality functions of source and reference meter
Table H.2 โ€“ Uncertainty of source and reference meter
Table H.3 โ€“ Stability of source
139 H.5 Traceability
140 Annex I (informative) Recommendations related to a declaration of conformity (DoC) and a test report
I.1 Definitions
I.2 Recommendations
I.3 Example of IEC 62586-1 declaration of conformity
141 Table I.1 โ€“ Example of a DoC related to compliance with IEC 62586-1
142 I.4 Example of IEC 62586-2 declaration
I.4.1 General
143 I.4.2 Recommendation for IEC 62586-2 test report
Table I.2 โ€“ Example of DoC related to compliance with IEC 62586-2
144 I.4.3 Recommendation for IEC 62586-2 test summary
I.4.4 Recommendation for IEC 62586-2 test equipment information
I.4.5 Recommendation for IEC 62586-2 tested functions
145 Bibliography

Related products

BS EN 62586-2:2017
$256.21