BS EN 60749-8:2003

$102.76

Semiconductor devices. Mechanical and climatic test methods – Sealing

Published By	Publication Date	Number of Pages
BSI	2003	20

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Categories: 31.080.01 - Semiconductor devices in general, BSI

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Description

Applicable to semiconductor devices (discrete devices and integrated circuits), it determines the leak rate of semiconductor devices. The contents of the corrigenda of April 2003 and August 2003 have been included in this copy.

Additional information

Status	Definitive
Pages	20
Publication Date	2003-07-03
ISBN	0 580 42201 1
Standard Number	BS EN 60749-8:2003
Title	Semiconductor devices. Mechanical and climatic test methods – Sealing
Identical National Standard Of	EN 60749-8:2003, IEC 60749-8:2002, IEC 60749-8:2002/COR1:2003
Replaces	BS EN 60749:1999
Descriptors	Climate, Leak tests, Integrated circuits, Semiconductor devices, Environmental testing, Electronic equipment and components, Mechanical testing, Seals
Publisher	BSI
Committee	EPL/47
ICS Codes	31.080.01 - Semiconductor devices in general

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BS EN 60749-8:2003

$102.76


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